367 engineering-computation-"https:"-"https:"-"https:"-"https:"-"https:"-"https:"-"L2CM" positions at NIST in United States
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of structural responses for performance-based seismic engineering of tall buildings. Opportunities include the following: (1) developing improved modeling and analytical capabilities for nonlinear dynamic
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RAP opportunity at National Institute of Standards and Technology NIST Creating Computational Techniques to Investigate the Ensemble Structures of Flexible Proteins In Combination with Neutron
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browsing capabilities. A small subset of project relevant publications is listed below. Requirements:A candidate should have at least a master’s degree in computer science or related fields (PhD is preferred
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RAP opportunity at National Institute of Standards and Technology NIST Machine Learning for Autonomous Genetic Engineering of Microbial Systems Location Material Measurement Laboratory
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Computational Methods for NMR Structural Biology and Biomanufacturing of Protein and Live Cell Therapeutics NIST only participates in the February and August reviews. Protein therapeutics
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RAP opportunity at National Institute of Standards and Technology NIST Development of New Computational Methodologies for Molecular Simulation of Soft Materials Location Material Measurement
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are encouraged to submit research proposals on the following topics: DFT and MD for computational dielectric spectroscopy Properties of electrochemical double layer (effects on the local polarization, structure
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for achieving recovery-based objectives, (3) computing the collapse risk of new and existing buildings and infrastructure systems, (3) developing improved nonlinear modeling capabilities to evaluate the response
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attracted considerable attention for potential application in nanoscale devices, including beyond-CMOS electronics, quantum computers, chemical sensors, photodetectors, etc. Prospective advantages over
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Advanced Functionalities in Photonics using Low-Dimensional Semiconductors Location Material Measurement