274 web-programmer-developer-"https:"-"UCL"-"P"-"https:"-"CERIC-ERIC" positions at NIST in United States
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(1) development of nanoscale characterization techniques to measure mechanical, chemical, and rheological properties of microscopic volume elements with nanoscale spatial resolution using atomic force
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quantitation of the effects of environmental context and evolution. The Group aims to advance fundamental understanding, improve predictability for design, ensure reproducibility and comparability, and
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. Opportunities exist for (1) developing a framework for design of buildings and infrastructure systems to meet recovery-based objectives (functional recovery framework), (2) developing design criteria
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(e.g., thermogravimetric analysis, differential scanning calorimetry, and dynamic mechanical analysis, etc.), (5) developing mechanical test methods for samples (at small and structural-level scales
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using novel analytical approaches. Specifically, this research will focus on (1) development of laboratory methods to produce controlled-size micro- and nanoplastics; (2) development of field-flow
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development of RF MEMS/NEMS resonators. Several resonator geometries are being developed that combine low-loss mechanical design, unique materials, and electrostatic, electrothermal, and piezoelectric actuation
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evolution. The Group aims to advance fundamental understanding, improve predictability for design, ensure reproducibility and comparability, and facilitate scalability for real-world applications
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. In this project, we are developing metrology needed for the synthesis, processing, and characterization of low-dimensional materials to enable reliable nanoscale device development and manufacturing
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Tytus Dehinn Mui Mak tytus.mak@nist.gov 202.360.6799 Description In the past decade, the rapid pace of development in mass spectrometry technologies has accelerated the rise of metabolomics and resulted
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@nist.gov 301.975.2860 Description New developments in detector technology have made possible the acquisition of the full electron scattering distribution at each pixel in a scanning transmission electron