276 web-programmer-developer-"https:"-"UCL"-"P"-"https:"-"https:" positions at NIST in United States
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NIST only participates in the February and August reviews. This project’s focus is to develop light-scattering nanoscopy methods for rapid, multi-attribute characterization of nanoparticles
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. At NIST, we use large-geometry SIMS instruments to develop new particle analysis methods, improve analytical accuracy and reproducibility, and collaboratively develop new microparticle reference materials
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of the inflaton potential. Such experiments require even more precise measurement of the polarization of the microwave background with exquisite control of systematic errors. NIST is developing polarization
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Description We are currently developing microsystems for multiplexed biomolecular analysis (e.g., gene expression, microRNAs, proteins, cytokines) at the single cell level. Research goals include developing
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303.497.4740 Description Our project has been developing single photon detectors and sources for use in a variety of applications requiring light at the faintest levels. We are currently involved in
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for postdoctoral applicants to develop SEM reference samples in NIST’s NanoFab and to develop models to simulate electron scattering, secondary electron generation, electron transport, scattering in gases
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are developing the next-generation deployable, calibration-free Doppler thermometers. The Doppler broadening of spectral lines relates gas temperature to SI-defining physical constants and immutable gas
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Description The National Institute of Standards and Technology (NIST) is developing next-generation microfabricated magnetic devices and magnetic resonance imaging (MRI) contrast agents and sensors based
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) to characterize the nuclear motions associated with the observed THz features. New methods based on electro-optical dual-optical-frequency combs and room-temperature multi-heterodyne detection are under development
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interact, even strongly, with its environment or exist within densely integrated technologies. This project seeks to develop the metrological and fabrication framework necessary to understand and manipulate