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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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https://seuelectronica.upc.edu/en/procedures/call-for-recruitment-of-pdi-postdo… Requirements Research FieldPhysics » ElectronicsEducation LevelPhD or equivalent Research FieldChemistryEducation LevelPhD
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