Sort by
Refine Your Search
-
Category
-
Program
-
Employer
-
Field
-
measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs
-
, additional material characterisation with techniques such as X-ray diffraction, X-ray and neutron reflectometry and X-ray photoemesion spectroscopy will be used to provide a fundamental understanding of the
-
simultaneous wave interactions, including reflections, diffractions, refraction, and turbulence-induced scattering. Such effects not only complicate noise prediction but also disrupt conventional approaches
Enter an email to receive alerts for diffraction "https:" positions