Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
Theory / Scattering Amplitudes , Precision Calculation for Collider Physics , Precision Electroweak , Standard Model phenomenology , Theoretical High-Energy , Theoretical Particle Physics Particle Theory
-
squats throughout the day. Position requires candidates to be on their feet most of the day. Will be working in scattered site ‘off-campus’ buildings. Occasional seasonal weekend shifts may be required
-
about the center here: https://pharmacy.ku.dk/research/caiff/ . The position is available from 1 April 2026, or as soon as possible thereafter. Position description As Tenure-Track Assistant/Associate
-
. intracellular movement) using full-field OCT (FF-OCT), compatible with in vivo imaging. Full-field OCT is an imaging technique that enables 3D microscopy in scattering media, such as biological tissues [1]. One
-
). The ICS has characterization platforms (UV-Vis and IR spectroscopies, size exclusion chromatography, light scattering, etc.) and microscopy (electronic and atomic force). The work will be done in
-
project. The Neola device provides a safe and non-invasive method to monitor the lungs of neonates in real-time. It uses a biomedical application of GASMAS technology (Gas in Scattering Media Absorption
-
capabilities for questions that push beyond standard methods. Recent FlexX advances—now available to users and still being refined—include fixed-target serial crystallography, support for diffuse scattering
-
research groups that specialize in neutron scattering, scanning probe microscopy, ARPES, and optical investigations; coordinate and interpret measurements; publicize research findings through presentations
-
in the field of X-ray computed tomography and material characterization. This Ph.D. posting is a part of the 14 Ph.D. positions related to the European project RELIANCE (https://euraxess.ec.europa.eu
-
fabrication processes and equipment for micro- and nanostructures. The facilities cover a comprehensive range of equipment, including atomic layer deposition devices, electron microscopy, x-ray scattering