Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
comprises four CNRS researchers and three engineers, and has an experimental setup including four scanning tunneling microscopes operating at low temperatures, three of which offer optical access
-
defended their PhD and have not yet undertaken a postdoctoral position are eligible. The candidate will carry out scanning tunneling microscopy (STM) experiments in a cryogenic and ultra-high-vacuum
-
electrocatalysis including quantitative product analysis, the synthesis of catalyst materials and in-situ analysis using electrochemical scanning tunnelling microscopy (EC-STM) Independent teaching in physical
-
or related field. Desired Qualifications Experience in the following areas is desirable: molecular beam epitaxy, low-temperature scanning tunneling microscopy/spectroscopy, non-contact atomic force
-
fabrication, electron beam lithography nanofabrication, low temperature magneto-transport, scanning tunneling microscopy, scanning near field optical microscopy, low temperature optical microscopy. FLSA Exempt
-
lithography nanofabrication, low temperature magneto-transport, scanning tunneling microscopy, scanning near field optical microscopy, low temperature optical microscopy. FLSA Exempt Full Time/Part Time Full
-
work in the laboratory for Quantum Magnetism fully equipped with low-temperature, high magnetic field scanning tunneling microscopy (STM) and tuning fork atomic force microscopy (QPlus AFM), integrated
-
properties of molecules and/or 2D materials is an advantage Knowledge of theory of plasmonics and nanophotonics and methods used therein is an advantage Modelling of scanning-tunneling microscopy and related
-
or related field. Desired Qualifications Experience in the following areas is desirable: molecular beam epitaxy, low-temperature scanning tunneling microscopy/spectroscopy, non-contact atomic force
-
techniques, including ambient pressure electron spectroscopy (XPS, UPS, AES), high pressure scanning tunneling microscopy (STM), and related methods. Structural characterization of materials using synchrotron