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chemical properties of defected WS2 via multiple experimental techniques (examples are – but not limited to – scanning tunneling microscopy, angle resolved photoemission spectroscopy, Raman spectroscopy, X
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variety of nanoscale measurement and manipulation techniques, ranging from scanning probe microscopies, such as atomic force (AFM), scanning tunneling (STM), and nearfield optical (NSOM), to sample
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significant challenge. Our laboratory advances atomic-scale spectroscopy based on photon scanning tunneling microscopy (Photon-STM) to directly correlate the local structure and energy conversion properties
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use scanning tunneling microscopy (STM), combined with electron spin resonance (ESR), to address the spin states of individual atoms. Making use of advanced nanosecond pulsed measurement techniques, you
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, surface analysis or manufacturing systems Hands-on experience with techniques such as Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Skills needed: Knowledge of semiconductor device