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-throughput characterization methods include spectroscopy, optical and scanned probe microscopy, scattering, reflectivity, ellipsometry, and contact angle measurements. See http://www.nist.gov/mml/polymers
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merit Be fluent in English Must have an experience with scanning probe microscopies, in particular, atomic force microscopy Knowing basics of IR spectroscopy based on a photothermal effect (oPTIR, sSNOM
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. Profile We are looking for a candidate who has: A PhD in Physics, Chemistry, Biophysics, or a closely related field Experience with atomic force microscopy or related scanning probe techniques Background
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/Qualifications MSc in physics, chemistry, materials science, or similar. Experience working with various nanostructures, especially in electron microscopy (both SEM (Scanning Electron Microscopy) and TEM
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disciplines is mandatory: aberration-corrected scanning transmission electron microscopy; micro- and nanofluidics; atomic force/scanning probe microscopy; free-space laser optics and preferably optical tweezing
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force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), and secondary ion mass spectrometry (SIMS). Electrical properties will be evaluated using Hall effect
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precision annealing by using a high repetition rate femtosecond laser. Objective 2: Nonlinear optical studies. The deposited and optimized 2D layers will be studied by means of the Z-scan technique, already
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optoelectronic properties at multiple length scales using advanced local microscopy and characterization techniques (such as scanning probe–based approaches); Study of charge transport, recombination, and
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microscopy and/or ultrafast optics would be an asset. Where to apply Website https://emploi.cnrs.fr/Candidat/Offre/UMR7504-GUISCH-002/Candidater.aspx Requirements Research FieldPhysicsEducation LevelPhD
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Foundation (NRF) Fellow at NTU MSE. Eason's research group focuses on materials characterization, metallurgy, and hydrogen technologies, particularly using advanced microscopy techniques such as atom probe