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microscopy (STM) and non-contact atomic force microscopy (nc-AFM) to elucidate their morphology and confirm their strictly 2D nature at the monolayer level, while scanning tunneling spectroscopy (STS) will be
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Institute of Fundamental Technological Research Polish Academy of Sciences | Poland | about 2 months ago
testing techniques (e.g., microbending, micropillar compression, and in-situ testing in a scanning electron microscope), as well as microstructural analysis using electron and scanning probe microscopy (SEM
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the MRL’s core facilities for electron microscopy in addition to other cores of shared instrumentation for scanning probe microscopy, laser and optical spectroscopy, surface, thermal and physical properties
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multiple length scales, combining tools such as electron microscopy, atom probe tomography, X-ray diffraction, and micro-mechanical testing. About the research project Bone is a remarkable material that
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. Profile We are looking for a candidate who has: A PhD in Physics, Chemistry, Biophysics, or a closely related field Experience with atomic force microscopy or related scanning probe techniques Background
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National Institutes of Natural Sciences, Institute for Molecular Science | Japan | about 1 month ago
science using scanning probe microscopy across atomic-to-mesoscale regimes in collaboration with Professor Hiroshi Imada (scheduled to start his post at IMS on May 1, 2026). Participation in managements
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Foundation (NRF) Fellow at NTU MSE. Eason's research group focuses on materials characterization, metallurgy, and hydrogen technologies, particularly using advanced microscopy techniques such as atom probe
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precision annealing by using a high repetition rate femtosecond laser. Objective 2: Nonlinear optical studies. The deposited and optimized 2D layers will be studied by means of the Z-scan technique, already
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optoelectronic properties at multiple length scales using advanced local microscopy and characterization techniques (such as scanning probe–based approaches); Study of charge transport, recombination, and
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variety of nanoscale measurement and manipulation techniques, ranging from scanning probe microscopies, such as atomic force (AFM), scanning tunneling (STM), and nearfield optical (NSOM), to sample