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work will be on reliability analysis and diagnostics of medium-voltage SiC MOSFETs, including the development of advanced test platforms for device and packaging evaluation. Key responsibilities include
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difficult and the creation of more intelligent process control strategies and innovative methods of tracking reliability can be achieved with expert informed machine learning techniques, which offer more
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difficult and the creation of more intelligent process control strategies and innovative methods of tracking reliability can be achieved with expert informed machine learning techniques, which offer more
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