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on methodological development in cryo-electron microscopy (cryo-EM), particularly in image reconstruction and 3D volumetric analysis of macromolecular structures. Rather than aiming to incrementally optimize existing
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chemistry, organic chemistry, inorganic chemistry, physical chemistry, materials chemistry, and biochemistry. Basic Qualifications A postdoc position is available for the design, synthesis, electron
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found here https://www.maxiv.lu.se/beamlines- accelerators/support-labs/microscopy-labs/ . This is a temporary position from March until October 2026. Qualifications for a successful candidate are: Hold
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-electron microscopy (cryo-EM), particularly in image reconstruction and 3D volumetric analysis of macromolecular structures. Rather than aiming to incrementally optimize existing pipelines, we are interested
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scattering (SAXS) tensor tomography Develop correlative multi-scale analysis pipelines integrating SAXS tensor tomography and high-resolution X-ray tomography, and complementary electron microscopy data (in
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in transcriptome sequencing and analysis will be preferred. Prior experience in electron microscopy or mass spectrometry is advantageous but not required. Strong writing skills with a proven track
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Postdoctoral Position and Postdoctoral Fellowship (2yrs) in Intracellular Host-Pathogen Interactions
proteomics analyses. APPLICATION PROCEDURE Please note that the application procedures differ between the two postdoc projects. More information about the application procedures is provided here: https
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on the advanced characterization of nanostructure materials by transmission electron microscopy (TEM). Your profile: Ph.D. in Chemistry, Materials Science, Mechanical Engineering, or a related discipline Solid
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in transcriptome sequencing and analysis will be preferred. Prior experience in electron microscopy or mass spectrometry is advantageous but not required. Strong writing skills with a proven track
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testing techniques (e.g., microbending, micropillar compression, and in-situ testing in a scanning electron microscope), as well as microstructural analysis using electron and scanning probe microscopy (SEM