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traditional thin-film devices include exceptional structural quality, high surface-to-volume ratio, bottom-up device engineering with high-density on-chip integration, and utilization of quantum size effects
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RAP opportunity at National Institute of Standards and Technology NIST Investigations into Indoor Air Chemistry and Exposure Location Engineering Laboratory, Energy and Environment Division
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RAP opportunity at National Institute of Standards and Technology NIST Inter-spin Distance Measurements in Nanobiomaterials Location Physical Measurement Laboratory, Microsystems and
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RAP opportunity at National Institute of Standards and Technology NIST High Frequency Electrical Metrology for Three-Dimensional Integrated Circuits Location Physical Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Fundamentals of Charged Macromolecules at Interfaces Location Material Measurement Laboratory, Materials Science and
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RAP opportunity at National Institute of Standards and Technology NIST Four-Dimensional (4D) Scanning Transmission Electron Microscopy Location Material Measurement Laboratory, Materials
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RAP opportunity at National Institute of Standards and Technology NIST Development of Technologies to Enable Single Molecule Protein Sequencing Location Material Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Cryptography Through the Lens of Quantum Information Science Location Information Technology Laboratory, Computer Security
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RAP opportunity at National Institute of Standards and Technology NIST Catching Crooks with Chemistry Location Material Measurement Laboratory, Chemical Sciences Division opportunity location
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RAP opportunity at National Institute of Standards and Technology NIST Advanced Regulatory Science for Nanotechnology Location Material Measurement Laboratory, Materials Measurement Science