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epidemiology and statistical and mathematical modelling For appointment at grade 7: A4 Normally Scottish Credit and Qualification Framework level 12 (PhD) plus track record of emerging independence within a
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for a: PhD Candidate in Emotionally and Socially Aware Natural Language Processing (1.0fte) Project description Current Natural Language Processing (NLP) systems, and especially large language models
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Want to be part of a Europe-wide international group of 15 PhD students working on the circularity of footwear? Are you the one PhD candidate that will take circularity/sustainability assessment
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PhD position starting immediately is available in the laboratory of Prof. Tessa E.F. Quax in the department of Molecular Microbiology of the University of Groningen, The Netherlands.
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Max Planck Institute for Dynamics and Self-Organization, Göttingen | Gottingen, Niedersachsen | Germany | about 2 months ago
communication skills to join our research team. The PhD candidate should have: A Master’s degree (or comparable) in theoretical physics, applied mathematics or related disciplines from a recognized university
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, multimodal data, and explainability? This PhD project offers you the chance to develop novel AI methods that make powerful models more transparent, robust, and usable in critical domains such as healthcare and
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light at the quantum limit, and on the other hand to apply this knowledge in order to develop novel spectroscopic tools for medicine, biology and industrial material characterisation. The advertised PhD
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Researcher (R1) Positions PhD Positions Country Poland Application Deadline 30 Sep 2025 - 23:59 (Europe/Warsaw) Type of Contract Temporary Job Status Full-time Hours Per Week 40 Offer Starting Date 1 Feb 2026
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mathematics are welcome to apply. Hands-on experience in optical laboratories will be a plus. How to apply: Please visit the UCL i4health CDT webpage linked above for instructions on the application process. In
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geometry can be reconstructed mathematically (this is called inverse scattering). This requires both sophisticated mathematical models and efficiently implemented algorithms. In the case of wafer metrology