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precision microelectromechanical systems (MEMS) to improve measurement accuracy and throughput in scanning probe microscopy (SPM), particularly for scanning tunneling microscopy (STM) and atomic force
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Description By creating photon states with photon numbers of more than one, it is possible to make measurements with resolution beyond conventional limits. For example, in interferometric applications
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of these technologies are related to cell counting (“enumeration”) since cell count is often essential for interpretation of more complex measurements. Cell counting can seem like an easy measurement, but developing a
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NIST only participates in the February and August reviews. The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data
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browsing capabilities. A small subset of project relevant publications is listed below. Requirements:A candidate should have at least a master’s degree in computer science or related fields (PhD is preferred
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301.975.8087 Description One of the benefits of nanoimprint lithography (NIL) is that it can directly pattern functional materials, not just sacrificially resist formulations that are used to transfer
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NIST only participates in the February and August reviews. The goal of this project is to develop nano-electromagnetic imaging using scanning microwave, NV center, and magnetic resonance microscopy
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wyatt.vreeland@nist.gov 202 550 7183 Description Biological systems are inherently complex-the quantitative characterization of the state of such a system requires simultaneous measurement of many properties. Our
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is how chain architecture, main chain stiffness, and side group flexibility impacts the elastic modulus of ultrathin polymer films. Additionally, we are developing methods for quantifying the tensile
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Development of magnetism-based future electronics is fueled by demand for large memory capacity and high data processing rates. New technologies such as hard drives with bit-patterned media and magnetic memory