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of devices Experience with atomic force microscopy (AFM) and scanning electron microscopy (SEM) for device characterization. Solid understanding of condensed matter physics and materials science General Skills
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. Evaluate and understand how experimental conditions effect both the chemical, physical, and mechanical properties of the prepared films (e.g., using scanning electron and atomic force microscopy, infrared
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crosslinking/mass-spectrometry and single particle cryogenic electron microscopy on native or recombinant TZ complexes, you are expected to determine the molecular super-structure of TZ. You will monitor
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an integrative approach involving protein structure prediction by AlphaFold 3 combined with crosslinking/mass-spectrometry and single particle cryogenic electron microscopy on native or recombinant TZ complexes
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tweezers, super-resolution microscopy and cryo-electron microscopy. Start date: 1st September 2025 Duration: 1 year (in the first instance, with
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diffraction and related scattering methods, Raman spectroscopy, electron microscopy (SEM and TEM). Carry out electrochemical characterization of the materials in half cells as well as in full sodium ion battery
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-resolution microscopy established in the host lab and spearhead an interdisciplinary, collaborative project. Expected start date and duration of employment This is a one–year position from 1 October 2025
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-resolution microscopy established in the host lab and spearhead an interdisciplinary, collaborative project. Expected start date and duration of employment This is a one–year position from 1 October 2025
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Expertise in signal processing and electronic circuit design for precision instruments Experience with microscopy systems, particularly atomic force microscopy (AFM), is highly desirable Knowledge
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and energetic constrains ammonia-oxidizing and methane-oxidizing microbes exhibit under oxygen depletion (and while producing oxygen) including single cell activity assays. Applicants should have a PhD