Sort by
Refine Your Search
-
Listed
-
Employer
-
Field
-
project progress control ability, channel development and industry exhibition promotion ability Hard skills: 2 or more language skills, design software use and manufacturing processing ability Solid
-
data collection with stakeholders from participating schools, organize, and manage data storage (f) Process and conduct qualitative data analysis (i.e., transcribing, coding) (g) Write reports, be
-
hydrodynamic modelling and sediment transportation. Model Validation: Validation of DHI Mike Model with past historical data Data Analysis: Process and analyze coastal and ocean wave data to improve model
-
liaison with vendors/suppliers. Work independently, as well as within a team, to ensure proper operation and maintenance of equipment. Job Requirements: Have relevant competence in the areas of Deep
-
Join Us . Terms and conditions, according to university guidelines, are subject to change without prior notice. Application Process Please submit the following documents in one (combined) PDF and attach
-
with a team, have an investigative nature and attention to detail; have knowledge of computer applications (such as SPSS and MS Office, PowerPoint); and have good communication skills with patients and
-
areas: Time-series analytics or forecasting Natural language processing (especially question answering or language grounding) Multimodal learning (e.g., combining text with temporal or numerical data
-
, Yong Loo Lin School of Medicine at the National University of Singapore (NUS) is seeking a motivated and experienced Research Fellow (RF) or Research Associate (RAssoc) to join our dynamic team in
-
are especially encouraged. Application Process: Interested applicants should apply on AcademicJobsOnline, by June 13th, 2025. The application should include: - A CV (Required) - A writing sample (Required) - Three
-
development and optimization of plasma-based PVD and CVD processes for advanced material applications. Operate and maintain semiconductor analysis and metrology tools to evaluate thin film and device properties