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have largely operated in parallel, leaving significant opportunities for synergy unexplored. By integrating the two domains, process mining can benefit from visual analytics’ expertise in handling multi
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such, we are looking for a PhD candidate to take up the challenge of extending the capabilities of the spatial spectral methodology to more advanced wafer metrology applications. As a PhD candidate, you
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18 Sep 2025 Job Information Organisation/Company Eindhoven University of Technology (TU/e) Research Field Engineering » Computer engineering Engineering » Electrical engineering Physics
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