Sort by
Refine Your Search
-
monoclonal antibodies. References Arbogast LW, et al: 2D 1 HN , 15 N Correlated NMR Methods at Natural Abundance for Obtaining Structural Maps and Statistical Comparability of Monoclonal Antibodies
-
measure structural changes as the agents go from their biologically active to their biologically inactive forms. As analytical methods become available, studies of the physical and chemical processes
-
interactions will help as all source code, calculation methods, and results will be made openly available as described below. Processed results will be presented on the NIST Interatomic Potentials Repository
-
but inaccurate, leading to overconfidence in position data.This fundamental issue is becoming more important as localization microscopy matures, requiring not only novel methods but also reliable
-
-enhanced laser-based methods, optical spectroscopies (infrared, visible, ultraviolet, Raman, light scattering), gas chromatography/mass spectroscopy (GC/MS), high-performance liquid chromatography (HPLC
-
, high sensitivity methods for far-infrared detection, and wide bandwidth UV-IR devices for absolute calibration of incident photon flux. A qualified candidate would already have expertise in at least
-
infrastructure, development of methods for storage and transport of alternative fuels and development of critical data on effects of radiation on structural materials. Our laboratory also maintains the nation’s
-
to meet these demands. NIST also researches methods to improve physical environmental measurements made to complement or validate space-based measurements. The NIST effort is aided by specialized facilities
-
jared.wahlstrand@nist.gov 301 975 2547 Description Dynamics in semiconductor and other materials are studied using optical and THz pump-probe methods. Rapid changes in optical properties of materials are measured
-
angela.hightwalker@nist.gov 301.975.2155 Description Dynamics in semiconductor materials will be studied using optical pump-probe methods. Rapid changes in optical properties of materials are measured using