2 multiple-sequence-alignment Postdoctoral positions at Delft University of Technology (TU Delft); today published in Netherlands

Postdoc Photoacoustic Metrology

Delft University of Technology (TU Delft); today published | Netherlands | 12 days ago

well as the position of a wafer inside a lithography scanner (alignment). However, as modern integrated circuits often contain optically opaque materials, such optical metrology methods become challenging to use. A

Postdoc in 3D Geoinformation for Energy Data and Flexibility Management for PEDs

Delft University of Technology (TU Delft); today published | Netherlands | 18 days ago

Application Domain Extension (ADE) (https://github.com/tudelft3d/Energy_ADE) to deal with energy data coming from industrial sites, and further development of the data model to better align with energy-related