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About the role We are seeking a full-time post-doctoral research assistant to join the Dynamic Optics and Photonics research group at the Department of Engineering Science (central Oxford). The post is funded by the UK Engineering and Physical Sciences Research Council and is fixed-term to...
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Location: Holder Building, Parks Road, Oxford, OX1 3PJ About the role We are seeking a full-time post-doctoral research assistant to join the Dynamic Optics and Photonics research group at the Department of Engineering Science (central Oxford). The post is funded by the UK Engineering and...
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at rates approaching 200Hz. The combination of high rate and high fidelity remote entanglement has allowed us to make world-first demonstrations in the areas of quantum cryptography, quantum metrology, and
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and compare two distinct mathematical approaches to network metrology: Spectral analysis approach – based on network layer decomposition and spectral measures on singular values to mathematically
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experience or Bachelor’s degree with 3 years of post-qualification may be considered for appointment as Senior Research Assistant. Skills in metrology and 3D printing are advantageous. The appointee will work
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. The position is associated with a project funded by the EURAMET - the metrology component of the European Union Horizon 2020 Programme. The post holder will be expected to display the initiative and creativity
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, United States of America [map ] Subject Areas: Physics / Atomic, Molecular, and Optical Physics , Experimental Ultrafast Physics , Metrology , Optics and Photonics , Quantum Optics , Quantum Sensors , Ultrafast Science
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77843, United States of America [map ] Subject Areas: Physics / Atomic, Molecular, and Optical Physics , Biophysics , Experimental Ultrafast Physics , Metrology , Optics and Photonics , Quantum Computing
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, tailoring their structure by varying deposition conditions and introducing e.g barrier layers in order to control their response to thermal activation Develop usage of metrology tools to characterize
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integration. This role offers a unique opportunity to contribute to the development of novel nanoscale metrology frameworks with direct implications for the design of next-generation optoelectronic devices