Nano- and Atomic-Resolution Electron Microscopy of Three-Dimensional Structures

NIST, United States

Updated: about 3 hours ago
Location: Gaithersburg, MARYLAND

RAP opportunity at National Institute of Standards and Technology     NIST

Nano- and Atomic-Resolution Electron Microscopy of Three-Dimensional Structures


Location

Material Measurement Laboratory, Materials Measurement Science Division


opportunity location
50.64.31.B7958 Gaithersburg, MD

NIST only participates in the February and August reviews.


Advisers
name email phone
Andrew Anthony Herzing andrew.herzing@nist.gov 301.975.2860
Description

The modern transmission electron microscope (TEM) is capable of atomic-resolution structural and chemical imaging. However, such data typically only represents a two-dimensional (2-D) projection of the underlying physical or chemical structure. To characterize the three-dimensional (3-D) makeup of a specimen, electron tomography is often employed. This involves the computational determination of 3-D features of a specimen from a series of their 2-D projections. By carefully preparing the specimen, designing the experimental acquisition, and subsequent data processing, semi- and fully-quantitative 3-D characterization should be possible. The successful candidate should possess a strong foundation in TEM characterization. Experience with aberration-corrected electron optics and/or tomographic reconstruction techniques would be ideal, but not a prerequisite.

References

Herzing AA, Richter LJ, Anderson IM: Journal of Physical Chemistry C 114: 17501, 2010

Scott MC, et al: Nature 483: 444, 2012


key words

Electron microscopy; TEM; STEM; Tomography; Nanotechnology; Nanocharacterization; EELS; EDS; HAADF;


Eligibility

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants


Stipend
Base Stipend Travel Allotment Supplementation
$82,764.00 $3,000.00

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