MEMS-Based Scanning Probe Microscopy

NIST, United States

Updated: about 2 hours ago
Location: Gaithersburg, MARYLAND

RAP opportunity at National Institute of Standards and Technology     NIST

MEMS-Based Scanning Probe Microscopy


Location

Physical Measurement Laboratory, Engineering Physics Division


opportunity location
50.68.31.B7380 Gaithersburg, MD

NIST only participates in the February and August reviews.


Advisers
name email phone
Jason J. Gorman gorman@nist.gov 301.975.3446
Description

We are developing precision microelectromechanical systems (MEMS) to improve measurement accuracy and throughput in scanning probe microscopy (SPM), particularly for scanning tunneling microscopy (STM) and atomic force microscopy (AFM). STM and AFM have been invaluable tools in the growth of nanotechnology but are limited in measurement speed and scanning area, which has hampered their use as a manufacturing tool and in process control applications in the nanomanufacturing and semiconductor industries. Our research focuses on the miniaturization of SPM sensing mechanisms (e.g., active cantilevers), high-speed MEMS scanning stages, advanced motion control, and instrument system integration. Research opportunities are available in the areas of design and analysis of MEMS sensors and actuators, micro- and nanofabrication, and control system design and analysis.

key words

MEMS; Microelectromechanical systems; Atomic force microscopy; Scanning tunneling microscopy; AFM; STM; Control systems; Mechanical design; Position sensors;


Eligibility

Citizenship:  Open to U.S. citizens

Level:  Open to Postdoctoral applicants


Stipend
Base Stipend Travel Allotment Supplementation
$82,764.00 $3,000.00

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