1 image-segmentation Postdoctoral positions at Luxembourg Institute of Science and Technology

SD-26065 -POST-DOC IN METHOD DEVELOPMENT FOR HIGH RESOLUTION CHARACTERIZATION OF NOVEL SAFE AND SUSTAINABLE BY DESIGN MATERIALS

Luxembourg Institute of Science and Technology | Luxembourg | 3 days ago

Secondary Ion Mass Spectrometry (SIMS) add-on systems for focused ion beam (FIB)-based high resolution imaging workstations including FIB-SEM and helium ion microscopes. These platforms allow each a unique of