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SD-26065 -POST-DOC IN METHOD DEVELOPMENT FOR HIGH RESOLUTION CHARACTERIZATION OF NOVEL SAFE AND S...
, we have been developing Secondary Ion Mass Spectrometry (SIMS) add-on systems for focused ion beam (FIB)-based high resolution imaging workstations including FIB-SEM and helium ion microscopes
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) with hardware in the loop functionalities to test and validate AI-based solutions in complex operation environments Working with rapid prototyping tools (dSPACE) to recreate charging profiles and
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on the gathered knowledge, assemblies with new interfacial functionalities will be developed and tested. This position is in the frame of an industrial collaboration with Circuit Foil Luxembourg, a high-quality
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SD-25157 RESEARCHER IN ATMOSPHERIC PLASMA TREATMENT OF METALLIC SURFACES FOR INDUSTRIAL APPLICATIONS
occupying more than 5,000 square metres, including innovations in all that we do An environment encouraging curiosity, innovation and entrepreneurship in all areas Personalized learning programme to foster