Sort by
Refine Your Search
-
Category
-
Country
-
Program
-
Field
-
for nanometric ion implantation based on laser ionization of neutral atoms coupled to a focused ion beam (FIB). The researcher will take part in the design, implementation, and performance characterization
-
, and we work closely with the teams that operate these instruments. Current research projects include understanding how ion beams may heat the atmosphere during flares, a study of how varying electron
-
spectroscopy research group” (https://www.physics.gu.se/ english / research / laser spectroscopy). Here the holder of the position will take courses, get basic training in laser and ion beam technologies and
-
or aqueous batteries · solid knowledge of electrochemistry or relevant project experiences · experiences with operating scanning electron microscopy/focused ion beam · a high level of
-
. The candidate will first optimise sample preparation and then use the plasma focused ion beam technique to investigate how ion beam irradiation parameters, such as ion beam current, affect defect formation
-
(screening, modelling, forensics).Potential to suggest additional nuclides suitable for low terminal voltage AMS machines. Secondment: ETH Zurich, Laboratory of ion beam physics, prof. Marcus Christl, 3-4
-
with energies of one to tens of joules are focused onto a target, it is possible to generate bunches of electrons or light ions (protons, helium, carbon, ...) with charges from a few to hundreds of
-
of Schottky diodes and MOS capacitors on 4H-SiC substrates; • Controlled engineering of surface and interface defects using techniques such as focused ion beam (FIB), plasma nitridation, and plasma oxidation
-
ultrastructural methodologies at the heart of this project using cryo-electron tomography (cryo-ET) combined with cryogenic correlated light and electron microscopy (cryo-CLEM) and cryo-focused ion beam (cryo-FIB
-
& Tomography Core Facility, which contains four electron microscopes including North America’s first “Aquilos 2”-model cryogenic focused ion beam/scanning electron microscope as well as a Krios cryoTEM. Position