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RAP opportunity at National Institute of Standards and Technology NIST Applied Optimization and Simulation Location Information Technology Laboratory, Applied and Computational Mathematics
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market value. Multiple disciplines will be considered, including engineering (e.g., civil, industrial, operations research, computer science), economics (applied, micro, macro), social sciences (e.g
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RAP opportunity at National Institute of Standards and Technology NIST Advanced Regulatory Science for Nanotechnology Location Material Measurement Laboratory, Materials Measurement Science
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RAP opportunity at National Institute of Standards and Technology NIST Advanced Imaging and Mechanical Characterization of Polymer Matrix Composite Interfaces Location Material Measurement
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Microstructure of Structural and Functional Ceramics for Additive Manufacturing, Energy Conversion and Storage NIST only participates in the February and August reviews. Control of microstructure, internal dynamics, materials physics and chemistry is of primary importance in determining the...
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Metrology and Prototyping of Wide-Bandgap Semiconductor Quantum Nanowire Structures and Devices NIST only participates in the February and August reviews. Semiconductor quantum nanowires offer new applications in areas such as chemical sensors, NEMs, nanolasers, and nanoscale thermoelectric...
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RAP opportunity at National Institute of Standards and Technology NIST Large Eddy Simulation of Fires and Combustion Systems Location Engineering Laboratory, Fire Research Division opportunity
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NIST only participates in the February and August reviews. The Communications Technology Laboratories (CTL) at NIST is looking for a postdoctoral fellow to work to develop high-throughput materials
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RAP opportunity at National Institute of Standards and Technology NIST High Rate Mechanical Properties of Materials Location Material Measurement Laboratory, Materials Science and Engineering
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Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses. ECS Journal of Solid State Science and Technology 4(1) SI: N3113-N3117, 2015 Okoro CA, et al: A Detailed Failure Analysis