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information science and light–matter engineering, while engaging with CNM’s cleanroom and characterization capabilities, APS ultrafast and nanoprobe X-ray beamlines, MSD’s THz initiatives, and Q-NEXT’s national quantum
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contribute to open-source code repositories and documentation. Position Requirements Required skills, knowledge and qualifications: PhD in physical oceanography, coastal engineering, computational science
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spectrometers at the Advanced Photon Source. The successful candidate will work at the interface of cutting-edge cryogenic detector technology and synchrotron science, helping to integrate TES spectrometers
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, engineering, computational science, a physical science (materials science, chemistry, physics etc.), or related field. Hands-on experience with AI frameworks and employing large language models. Strong Python
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). About Argonne and the Physics Division: Argonne is a multidisciplinary science and engineering research center, where talented scientists and engineers work together to answer the biggest questions facing
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computational research in accelerator science and technology. The focus is on developing and applying machine learning (ML) methods for accelerator operations and beam-dynamics optimization in advanced
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Postdoctoral Appointee - Investigation of Electrocatalytic Interfaces with Advanced X-ray Microscopy
5 years or soon-to-be-completed in physics, materials science, chemistry, chemical engineering, or a related field. Demonstrated expertise in synchrotron-based XFM or related X-ray microscopy methods
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Argonne National Laboratory invites applications for postdoctoral research positions in experimental physics, with a focus on advancing superconducting particle detector technology for next
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the past five years or soon-to-be completed in physics, materials science, chemistry, engineering, or a related discipline. Demonstrated expertise in one or more synchrotron X-ray methods such as BCDI, XPCS
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Argonne’s Nanoscience and Technology Division seeks a postdoctoral scientist to advance transmission electron microscopy (TEM) studies of materials and interfaces relevant to microelectronics