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Postdoctoral researcher in Environmental Analytical Chemistry, with a focus on non-target screeni...
submitted your application, you must send this person’s details (name, job title, place of work, and email address) as well as the name of the position you have applied for to: HR.Nattech@au.dk Formalities
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into consideration. If you wish to add a referee after you have submitted your application, you must send this person’s details (name, job title, place of work, and email address) as well as the name of the position
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this person’s details (name, job title, place of work, and email address) as well as the name of the position you have applied for to: HR.Nattech@au.dk Formalities and salary range Technical Sciences refers
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be taken into consideration. If you wish to add a referee after you have submitted your application, you must send this person’s details (name, job title, place of work, and email address) as
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submitted your application, you must send this person’s details (name, job title, place of work, and email address) as well as the name of the position you have applied for to: HR.Nattech@au.dk Formalities
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, to multiphysics simulation and optimisation. SDU-ME is part of the Institute of Mechanical and Electrical Engineering (SDU-IME), which is a multidisciplinary department covering high-frequency electronics, super
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submitted your application, you must send this person’s details (name, job title, place of work, and email address) as well as the name of the position you have applied for to: HR.Nattech@au.dk Formalities
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, place of work, and email address) as well as the name of the position you have applied for to: HR.Nattech@au.dk Formalities and salary range Natural Sciences refers to the Ministerial Order on
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submitted electronically using the link “Apply now” - see below. We strongly recommend that you read How to apply for a position at SDU before you apply. Only applications written in English will be accepted
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Expertise in signal processing and electronic circuit design for precision instruments Experience with microscopy systems, particularly atomic force microscopy (AFM), is highly desirable Knowledge