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shared technical platforms in mechanics, electronics and instrumentation. Where to apply Website https://emploi.cnrs.fr/Candidat/Offre/UMR8214-SANLEV-037/Candidater.aspx Requirements Research
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in cutting-edge histology/imaging techniques including quantitative bright-field and fluorescence microscopy, confocal microscopy, and electron microscopy is required. Strong computer skills (MS Word
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, electronics, image and data analysis, chemistry, and biology. In this position, the successful candidate will work on the development of a novel three-dimensional single-molecule localization microscopy
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. Describe a deep learning project you have executed—ideally a creative use of a vision transformer, U-Net architecture, or Diffusion model that you trained yourself. Projects in computer vision for microscopy
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of view (Raman spectroscopy, scanning electron microscopy, atomic force microscopy, etc.); - Participate in progress meetings and report writing. The work will be carried out at the Laboratory
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role in establishing the University Research Facility in Materials Characterization and Device Fabrication, which includes a Materials Research Centre, a Centre for Electron Microscopy, an Atomic
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) electrochemistry, (3) catalysis, (4) analytical electron microscopy. The candidate will possess a creative, analytical approach to problem solving, the ability to work independently and the willingness to engage in
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of an acquired immune response. We welcome applications from PhD graduates who are interested in this or a related field, particularly those who may bring a new technology, and/or advanced microscopy skills and/or
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equivalencies: https://hr.uky.edu/employment/working-uk/equivalencies Required Related Experience No experience required. Required License/Registration/Certification Certification Physical Requirements Regularly
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Sorbonne Université SIS (Sciences, Ingénierie, Santé) | Paris 15, le de France | France | 14 days ago
étudiera la croissance et la structure de l'étain par microscopie à effet tunnel et diffraction des rayons X de surface sur synchrotron. Des résultats préliminaires ont déjà été obtenus sur les surfaces Ag