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of devices Experience with atomic force microscopy (AFM) and scanning electron microscopy (SEM) for device characterization. Solid understanding of condensed matter physics and materials science General Skills
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microscopy, optical interferometry, vacuum technology, finite element method simulations will be involved. Applicants should hold a PhD in Physics, Nano-science, Engineering or similar, experience with optics
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microscopy, optical interferometry, vacuum technology, finite element method simulations will be involved. Applicants should hold a PhD in Physics, Nano-science, Engineering or similar, experience with optics
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. Evaluate and understand how experimental conditions effect both the chemical, physical, and mechanical properties of the prepared films (e.g., using scanning electron and atomic force microscopy, infrared
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an integrative approach involving protein structure prediction by AlphaFold 3 combined with crosslinking/mass-spectrometry and single particle cryogenic electron microscopy on native or recombinant TZ complexes
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-resolution microscopy established in the host lab and spearhead an interdisciplinary, collaborative project. Expected start date and duration of employment This is a one–year position from 1 October 2025
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Expertise in signal processing and electronic circuit design for precision instruments Experience with microscopy systems, particularly atomic force microscopy (AFM), is highly desirable Knowledge
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diffraction and related scattering methods, Raman spectroscopy, electron microscopy (SEM and TEM). Carry out electrochemical characterization of the materials in half cells as well as in full sodium ion battery
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with experience in one of the following directions: Analysis of meta-omics data sets, microbial physiology and cultivation, enzyme biochemistry or activity-based microscopy techniques (e.g. BONCAT
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University is a modern research and education center with a particular emphasis on collaboration across traditional disciplinary boundaries. iNANO is equipped with state-of-the-art facilities in microscopy