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Institut of Mineralogy, Physics of Materials and Cosmochemistry | Paris 15, le de France | France | 16 days ago
the altermagnetic properties. Among external parameters, strain is a powerful tool, able to modify the electronic band structure or the magnetic anisotropy, with direct impact on the magnetic properties
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-ray diffraction The samples will be further characteried with optical spectroscopy experiments, as well as magnetothermodynamic, magnetomechanical and magnetoacoustic measurements at mK-temperatures and
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numerical results with observations from scanning and transmission electron microscopy provided by the partners of the ANR project IMP3D (https://anr.fr/Projet-ANR-24-CE08-3737 . - Select a discrete
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diffraction analyses of pure substances, molten mixtures, or solidified mixtures after experiments. Dr. Blanka Kubíková. Keywords: molten fluorides, critical elements, physicochemical analysis, spectral and
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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internationales établies pour les mesures de propriétés physiques spécifiques, de diffraction avancée et de synthèses particulières
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.: +33 (0)4 76 88 22 80, email: schulli@esrf.fr ), Expected profile A background in X-ray diffraction or electronics would be desirable and knowledge of programming (Python) would be an advantage. Teamwork
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variety of materials characterization techniques including: optical microscopy, scanning electron microscopy-energy dispersive spectroscopy (SEM-EDS), X-ray diffraction (XRD) with Rietveld knowledge, gas
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motion and how these depend on metal identity, bonding characteristics, oxide structure, proton density, ligands, and reaction conditions. By combining diffraction, spectroscopy, and advanced simulations
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vibrant structural biology community. The role blends (1) expert user support for routine and advanced macromolecular crystallography (MX) and (2) collaborative development of new X-ray diffraction