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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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electromagnetic modes. These systems are investigated using advanced optical spectroscopy and near-field techniques to access nanoscale optical phenomena beyond the diffraction limit. The research integrates design
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.: +33 (0)4 76 88 22 80, email: schulli@esrf.fr ), Expected profile A background in X-ray diffraction or electronics would be desirable and knowledge of programming (Python) would be an advantage. Teamwork
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, biochemistry, cryogenic electron microscopy, and protein crystallography facilities. The laboratory has access to many exceptional Cores, facilitating basic research and drug development. The unique
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PROJET-PEPR : MOF composites for the overall CO₂ reduction through panchromatic photocatalysis (M/F)
the solar spectrum, allowing efficient CO2RR using water as a sacrificial electron donor. CO₂ is often regarded as a cost-free C1 feedstock, making its conversion into high value-added synthetic fuels
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Institute of Low Temperature and Structure Research Polish Academy of Sciences | Poland | 5 days ago
relationships, the obtained materials will be in-depth characterized using advanced techniques, including powder X-ray diffraction, transmission and scanning electron microscopy, photoelectron spectroscopy, X-ray
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for a three-year Postdoctoral Research Fellow position in Optical Diffraction Tomography (ODT) within the Photonics Research Group at the Department of Physics and Technology . The position will be hosted
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Laboratory, Materials Measurement Science Division/Brookhaven Lab opportunity location 50.64.35.C0924 Upton, NY 11973 NIST only participates in the February and August reviews. Advisers name email phone Bruce
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neutron scattering, diffraction, and imaging, in close collaboration with beamline teams at SLS and SINQ. The postdoctoral fellow will work closely with the Coherent X-ray Scattering Group (CXS
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several real-time growth monitoring tools: RHEED (reflection high-energy electron diffraction), ellipsometry, wafer curvature measurements⁶, and an optical flux measurement system⁷. These tools are now