Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
Posting Summary Logo Posting Number RTF00239PO25 USC Market Title Post Doctoral Fellow Link to USC Market Title https://uscjobs.sc.edu/titles/156387 Business Title (Internal Title) Postdoctoral
-
Posting Summary Logo Posting Number RTF00239PO25 USC Market Title Post Doctoral Fellow Link to USC Market Title https://uscjobs.sc.edu/titles/156387 Business Title (Internal Title) Postdoctoral
-
. This would require knowledge in the design and synthesis of porous frameworks, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction, electron microscopy
-
piezoeléctricos/Sputtering of piezoelectric materials • Litografía óptica y por haz de electrones, metalización y ataque por plasma/Electron beam and optical lithographies, metallization, plasma etching
-
workflows for the analysis of the local structure in soft functional materials (semi-crystalline and amorphous materials) using electron diffraction and electron energy loss spectroscopy methodologies. You
-
generation and laser-induced electron diffraction. In particular, we aim to translate the seminal concepts of strong-field physics towards the weak-field regime for the first time. This achievement would
-
simultaneous wave interactions, including reflections, diffractions, refraction, and turbulence-induced scattering. Such effects not only complicate noise prediction but also disrupt conventional approaches
-
for the conversion of plastic-derived monomers; (b) Characterizing these electrocatalysts using a range of techniques, including electron microscopy, diffraction, and other complementary methods; (c) Developing and
-
The Division of Synchrotron Radiation Research (http://www.sljus.lu.se ) is a part of the Department of Physics and has more than 50 employees. The focus of the research is on experimental studies
-
and thickness. Perform comprehensive characterization of perovskite thin films using techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and UV