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evolution reaction (OER), a major bottleneck in current electrolysis processes, and explore stabilization strategies based on protective layers. Study the electronic structure of the hybrid catalysts and
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data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in computational
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IM2NP (Institut Matériaux Microélectronique Nanosciences de Provence) UMR CNRS 7334 Aix Marseille Université | Marseille, Provence Alpes Cote d Azur | France | 25 days ago
caractérisation ex situ de la structure de grains (EBSD - Electron BackScatter Diffraction) au laboratoire MSMP (Laboratoire Mécanique, Surface, Matériaux et Procédés, Aix-en-Provence) et des techniques pour
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techniques: X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), N₂ adsorption/desorption, scanning and transmission electron microscopy (SEM/TEM), confocal microscopy, small-angle X-ray
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multiple length scales, combining tools such as electron microscopy, atom probe tomography, X-ray diffraction, and micro-mechanical testing. About the research project Bone is a remarkable material that
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details, please visit our website at https://slst.shanghaitech.edu.cn/main.htm Shanghai Institute for Advanced Immunochemical Studies (SIAIS) Shanghai Institute for Advanced Immunochemical Studies (SIAIS
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properties. Surface characterization will be carried out using techniques such as optical microscopy, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD
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diffraction and pair distribution function analysis, infrared spectroscopy, and µ-Raman spectroscopy. Chemical mapping and phase speciation will be evaluated by fluorescence and X-ray absorption spectroscopy
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fluorescence (XRF), x-ray diffraction (XRD), scanning electron microscopy (SEM), and isotope geochemistry Conducting analyses using ICP-MS, ICP-OES, XRF and colorimetric techniques in consultation with
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plasma-assisted CVD techniques; - Knowledge of characterization techniques: Raman spectroscopy, scanning electron microscopy, atomic force microscopy, X-ray diffraction, etc.; - Knowledge of vacuum