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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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numerical results with observations from scanning and transmission electron microscopy provided by the partners of the ANR project IMP3D (https://anr.fr/Projet-ANR-24-CE08-3737 . - Select a discrete
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diffraction analyses of pure substances, molten mixtures, or solidified mixtures after experiments. Dr. Blanka Kubíková. Keywords: molten fluorides, critical elements, physicochemical analysis, spectral and
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.: +33 (0)4 76 88 22 80, email: schulli@esrf.fr ), Expected profile A background in X-ray diffraction or electronics would be desirable and knowledge of programming (Python) would be an advantage. Teamwork
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solutions for pressing societal challenges (e.g. communication, artificial intelligence, climate protection, health, etc.) through modern electronic & photonic technologies. The work covers the entire
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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phase of the project, electron-transparent specimens will be prepared for TEM examination using plasma focused ion beam milling (FIB), followed by structural, compositional and electronic characterisation
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data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in computational
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. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated