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Laboratory, Materials Measurement Science Division/Brookhaven Lab opportunity location 50.64.35.C0924 Upton, NY 11973 NIST only participates in the February and August reviews. Advisers name email phone Bruce
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Institute of Low Temperature and Structure Research Polish Academy of Sciences | Poland | 9 days ago
relationships, the obtained materials will be in-depth characterized using advanced techniques, including powder X-ray diffraction, transmission and scanning electron microscopy, photoelectron spectroscopy, X-ray
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neutron scattering, diffraction, and imaging, in close collaboration with beamline teams at SLS and SINQ. The postdoctoral fellow will work closely with the Coherent X-ray Scattering Group (CXS
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several real-time growth monitoring tools: RHEED (reflection high-energy electron diffraction), ellipsometry, wafer curvature measurements⁶, and an optical flux measurement system⁷. These tools are now
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(specular reflection). However, faulted zones with high contrasts imply multiple diffraction phenomena. The first objective is therefore to see whether the matrix approach can be successfully applied
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structural characterization of the corneocyte–lipid interface using state-of-the-art neutron diffraction and neutron reflectometry, combined with advanced optical microscopy approaches. The project is
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transmission electron microscopy (TEM), atomic force microscopy (AFM), and X-ray diffraction (XRD), etc. Prepare manuscripts, reports, and presentations for internal discussions and external publication
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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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solutions for pressing societal challenges (e.g. communication, artificial intelligence, climate protection, health, etc.) through modern electronic & photonic technologies. The work covers the entire
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IM2NP (Institut Matériaux Microélectronique Nanosciences de Provence) UMR CNRS 7334 Aix Marseille Université | Marseille, Provence Alpes Cote d Azur | France | 17 days ago
caractérisation ex situ de la structure de grains (EBSD - Electron BackScatter Diffraction) au laboratoire MSMP (Laboratoire Mécanique, Surface, Matériaux et Procédés, Aix-en-Provence) et des techniques pour