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Posting Summary Logo Posting Number RTF00239PO25 USC Market Title Post Doctoral Fellow Link to USC Market Title https://uscjobs.sc.edu/titles/156387 Business Title (Internal Title) Postdoctoral
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thinking and good problem-solving skills. Merits Practical experience of cement-related processes is a merit. Furthermore, documented experience of various experimental techniques in X-ray diffraction
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-element simulations; and experience in the development of hardware and software for the control and data acquisition of negative thermal expansion measurements (e.g., X-ray diffraction and/or strain as a
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Commissariat à l'Energie Atomique et aux Energies Alternatives - Groupe | Gif sur Yvette, le de France | France | 2 months ago
techniques including synchrotron radiation induced Hard X-ray photoelectron spectroscopy and complementary structural analysis including high-resolution electron microscopy, X-ray diffraction and near field
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impedance spectroscopy, thermogravimetry, dilatometry, X-ray diffraction, and scanning electron microscopy—to be used in an electrochemical device for the production of synthetic liquid fuels. 7. Applicable
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of the Registrar and the Comptroller, which establish the mandatory use of electronic means for the submission of applications, documentation, payment of fees, communications, notifications and all other procedures
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issues) Proficiency in operating and supporting materials science laboratory equipment, such as: X-ray diffraction (XRD) Scanning electron microscopy (SEM) and sample preparation tools Thermal and
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/interview Experience in one or more of: Steel processing Advanced characterization of steels, for example transmission electron microscopy and electron backscatter diffraction (EBSD). Mechanical property
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(ORD) and circular dichroism (CD), high-resolution mass spectroscopy (HRMS), cryo-electron microscopy (cryo-EM), electron microscopy and diffraction, alongside quantum mechanical models to analyze
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thermal analysis (DSC/TGA). Hands-on experience in materials characterization using tools such as particle size analysis, optical microscope, scanning electron microscopy, X-ray diffraction. Strong