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data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in computational
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evolution reaction (OER), a major bottleneck in current electrolysis processes, and explore stabilization strategies based on protective layers. Study the electronic structure of the hybrid catalysts and
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Chromatograph, Elemental Analyzer, Spectrophotometer, X-ray Diffraction Unit and any other shared teaching/research equipment. Train and oversee student use as needed. Repair and replace parts as needed. Maintain
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. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used
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plasma-assisted CVD techniques; - Knowledge of characterization techniques: Raman spectroscopy, scanning electron microscopy, atomic force microscopy, X-ray diffraction, etc.; - Knowledge of vacuum
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. The Materials for eXtremes (M4X) research group (https://more.bham.ac.uk/M4X/ ) investigates new alloys for extreme environments from fusion & fission reactors, to aerospace gas turbines and concentrated solar
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PhD student at ILL on Advanced Neutron Imaging for Defect Mapping in Repaired Aero-Engine Components
processes. Further information may be obtained from: Dr. Bratislav Lukic (tel.: +33 4 76 20 73 40, email: lukicb@ill.fr ), Dr. Matthew Roy (matthew.roy@manchester.ac.uk ), Pr. John Francis john.francis
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techniques such as Energy Dispersive X-Ray Spectroscopy (EDX), Backscattered Electron (BSE) imaging, and Selected Area Electron Diffraction (SAED). Extensive experience in processing samples for electron
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and intercellular transport using X-ray crystallography, cryo-electron microscopy (cryo-EM), microcrystal electron diffraction (microED), and small-angle X-ray scattering (SAXS). The Postdoctoral
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phase of the project, electron-transparent specimens will be prepared for TEM examination using plasma focused ion beam milling (FIB), followed by structural, compositional and electronic characterisation