Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
electronics familiarity - Familiarity with X-ray diffraction - Familiarity with Fourier transform infrared spectroscopy (FTIR) - Knowledge of python scientific stack (NumPy, SciPy
-
applicants to contact us by email in advance. Where to apply Website https://emploi.cnrs.fr/Offres/Doctorant/UPR8011-WOLBAC-001/Default.aspx Requirements Research FieldPhysicsEducation LevelPhD or equivalent
-
, Max IV, ESRF, Soleil, Diamond Light Source,...) and include High Energy Surface X-ray Diffraction (HESXRD) for surface structure determination, and gas phase X-ray Photoelectron Spectroscopy (XPS
-
ESPCI Ecole supérieure de physique et de chimie industrielles de la ville de Paris (PSL) | Paris 15, le de France | France | 28 days ago
19 Mar 2026 Job Information Organisation/Company ESPCI Ecole supérieure de physique et de chimie industrielles de la ville de Paris (PSL) Research Field Engineering » Electronic engineering
-
Sorbonne Université SIS (Sciences, Ingénierie, Santé) | Paris 15, le de France | France | about 1 month ago
étudiera la croissance et la structure de l'étain par microscopie à effet tunnel et diffraction des rayons X de surface sur synchrotron. Des résultats préliminaires ont déjà été obtenus sur les surfaces Ag
-
compounds. Intermetallic catalysts stand out for their exceptional stability and diverse atomic and electronic structures. This versatility allows them to perform efficiently under harsh conditions, offering
-
spintronics. Specifically, electron spectroscopy, electron diffraction, and scanning tunneling microscopy techniques will be used in vacuum. Magneto-optical characterizations will be performed on an optical
-
, chromatography, mass spectrometry, spectroscopic and diffraction methods (NMR, Raman, XRD, FTIR). Where to apply E-mail natjecaji.pisarnica@irb.hr Requirements Research FieldChemistry » OtherEducation LevelPhD
-
crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
-
, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction, electron microscopy, and porosity analysis. The candidate is expected to have a thorough understanding