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Field
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. Experience using analytical tools, such as particle size analyzer, X-Ray diffraction, electron microscopy (SEM and TEM), spectroscopy (FTIR and Raman), surface area analysis, and electrochemical (EIS and RDE
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experimental research with a focus on cryo-electron microscopy to understand how these ion channels are regulated under normal conditions and in disease states. Description of the AMBER project context This post
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. Conduct electrochemical characterization, including cyclic voltammetry, galvanostatic charge/discharge, and electrochemical impedance spectroscopy. Perform material characterization (X-ray diffraction
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microscopy, optical microscopy, x-ray diffraction, transmission electron microscopy desirable) Experience training and supervising students Teamwork, communication, and presentation skills A combination of
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the characterization and analysis of porous materials An excellent background in X-ray diffraction, electron diffraction, electron microscopy and related analytical techniques Open to learn new analytical tools, like
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experience in a variety of solid state synthesis techniques such as arc-melting, flux reactions and high temperature synthesis, in powder and single crystal X-ray diffraction analysis, electron microscopy
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Requisition Id 14936 Overview: We are seeking a Postdoctoral Research Associate who will reside in the Powder Diffraction Group in the Neutron Scattering Division (NSD), Neutron Sciences Directorate
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), including 4D-STEM, electron energy loss spectroscopy, and diffraction techniques for TEM Experience with cathodoluminescence microscopy in scanning electron microscope or scanning transmission electron
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techniques such as X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and UV-vis spectroscopy to study their structural, optical, and electronic properties. Fabricate
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Li-ion cathode materials using solid-state synthesis, sol-gel, co-precipitation, and hydrothermal methods. Structural and Chemical Characterization using: X-ray Powder Diffraction (XRD) and Rietveld