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scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), X-ray diffraction (XRD), and nanoindentation, for generating their own data sets Your Profile: A completed university degree
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scanning electron microscopy (SEM), electron backscatter diffraction (EBSD), X-ray diffraction (XRD), and nanoindentation, for generating their own data sets Your Profile: A completed university degree
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achieve this, the PhD candidate will employ advanced in situ and ex situ transmission electron microscopy (TEM) methods, alongside electron diffraction techniques, to investigate structural changes and
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for anti-counterfeiting textiles, based on smart security labels with multiple functionalities. 2. Applicable Legislation Decree-Law no. 57/2016 of August 29th, amended by Law 57/2017 and Regulatory Decree
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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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powder X-ray diffraction, SEM and electrochemical characterization techniques. General Requirements: very good university degree (M.Sc. or equivalent) in chemistry or materials sciences; specialization in
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optimal operating conditions and followed by surface analysis techniques (e.g. Scanning electron microscope, X-ray diffraction for residual stress measurements, Electron Back-Scattered Diffraction and
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the conventional manufacturing process of advanced aerospace materials but also the state-of-the-art materials investigation such as scanning electron microscope (SEM), X-ray diffraction (XRD), electron backscatter