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scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD) as well as sample preparation using a focused ion beam (FIB) for transmission electron microscopy (TEM). Established record
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-printing and stencil printing techniques – 10% IV. Development of multifunctional technologies integrated in textile substrates – 5% V. Characterization techniques, including electronic microscopy, energy
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ThermoFisher Helios 660 Nanolab dual-beam system, and various other capabilities. The NCMN manages a wide range of facilities, including x-ray diffraction and electron microscopy. Mechanical testing systems
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