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RAP opportunity at National Institute of Standards and Technology NIST Enabling Science from Big Microscopy Image Data Location Information Technology Laboratory, Software and Systems Division
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Description By creating photon states with photon numbers of more than one, it is possible to make measurements with resolution beyond conventional limits. For example, in interferometric applications
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Division opportunity location 50.77.31.C0556 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Carl Alexander Miller carl.miller@nist.gov (301) 975 5306
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for the chemical characterization of surfaces and interfaces found in heterogeneous thin film and nanoparticle systems. Of particular interest are species distributions on patterned surfaces, nucleation and film
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301.975.8087 Description One of the benefits of nanoimprint lithography (NIL) is that it can directly pattern functional materials, not just sacrificially resist formulations that are used to transfer
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NIST only participates in the February and August reviews. The goal of this project is to develop nano-electromagnetic imaging using scanning microwave, NV center, and magnetic resonance microscopy
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Heather Chen-Mayer chen-mayer@nist.gov 301.975.5595 Description The objective of this research is to develop new measurement capabilities for nuclear analytical techniques associated with the measurement
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renewable energy sources. Modern integrated building automation and control systems create an environment rich with sensor data and distributed control intelligence that can be applied to solve these problems
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@nist.gov 301.975.2860 Description New developments in detector technology have made possible the acquisition of the full electron scattering distribution at each pixel in a scanning transmission electron
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orientations in most engineering materials have some preferential distribution due to processing conditions and deformation history, referred to as crystallographic texture. This texture affects the initial