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techniques, including atomic imaging of surfaces and bulk, nano-probe diffraction (4D-STEM), high-energy-resolution, and valence-level energy-loss spectroscopy, cryogenic microscopy, Lorentz microscopy and
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radiation beamline hands-on experience in X?ray microscopy techniques, X?ray diffraction or X?ray fluorescence working knowledge of image processing e.g. using machine learning German skills For further
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systems were developed, innovative solution in diffractive optics and metamaterials for flat THz optics were suggested. Applications of THz structured light for imaging were studied establishing design
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in a vibrant and multidisciplinary and multinational environment (E) Experience in X-ray diffraction/imaging/spectroscopy techniques preferably synchrotron based (D) Experience in raising key issues
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characterization of C and SiC fibers - Training on bench use (in particular heating techniques by Joule effect, laser diffraction, infrared imaging, pyrometry, preparation of micrometric samples, ...) - Technical
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undergo comprehensive material characterization to assess layer quality through techniques such as high-resolution X-ray diffraction (HRXRD), X-ray photoelectron spectroscopy (XPS), ellipsometry, atomic
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experiments that require a focused coherent beam to achieve ultimate resolution, such as ptychography and coherent diffraction imaging. Secondly, the nanofocused beam also provides prime spatial resolution
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using scanning electron microscopes (SEM) and related techniques such as electron backscatter diffraction (EBSD), transmission Kikuchi diffraction (TKD), and electron channeling contrast imaging
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focus on probing the molecular factors underlying this instability (see for example https://www.nature.com/articles/s41467-019-08609-z/), and in understanding the pathway that link the functional and
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paramagnetic resonance (EPR), or magnetic resonance imaging (MRI) Familiarity with analytical tools: X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray computed tomography (XRCT) Expertise in