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radiography and diffraction measurement techniques with X-rays, allowing imaging of and diffraction information from the same volume. You will work together with other students in the network and take part in
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experiments as well as experiments in the lab. You will contribute to the development of simultaneous radiography and diffraction measurement techniques with X-rays, allowing imaging of and diffraction
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l'imagerie du vivant en permettant de localiser des molécules uniques au-delà de la limite de diffraction. Pourtant, ces approches reposent presque exclusivement sur l'analyse spatiale des images, ce qui les
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between two teams from laboratories in Toulouse: IRIT (Computer Science) and CEMES (Centre for Nanoscience and Materials). One team, led by E. Soubies, specializes in computational imaging and image
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-resolution imaging (twice the diffraction limit). This is accomplished by acquiring sequential speckle illumination images and processing them using Random Illumination Microscopy (RIM). This wide-field CARS
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electron microscopy (TEM/STEM) techniques for material characterisation, including high resolution imaging, spectroscopy (e.g., EDX) and diffraction. Demonstrated ability to analyse and interpret complex
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ESPCI Ecole supérieure de physique et de chimie industrielles de la ville de Paris (PSL) | Paris 15, le de France | France | about 1 month ago
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Université Paris-Saclay GS Sciences de l'ingénierie et des systèmes | Saint Aubin Routot, Haute Normandie | France | about 7 hours ago
Phase 1. Un premier un modèle morphologique par éléments finis (FEM) basé sur la segmentation d'images 3D qui incorporera les lois de comportements mécaniques obtenus. La segmentation des images 3D
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.; Burghammer, M.; Lyonnard, S.; Oukassi, S. Operando Imaging of Crystal Structure and Orientation in All Components of All-Solid-State-Batteries. arXiv February 5, 2025. https://doi.org/10.48550/arXiv.2502.03063
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imaging of subfield scattering targets." Optics Letters 41(21): 4959-4962, 2016. http://dx.doi.org/10.1364/OL.41.004959 Barnes BM, et al: "Three-dimensional deep sub-wavelength defect detection using l=193