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paramagnetic resonance (EPR), or magnetic resonance imaging (MRI) Familiarity with analytical tools: X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray computed tomography (XRCT) Expertise in
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DTU Tenure Track Researcher on Nanoreactors for Operando Visualizations of Nanoparticle Catalysis...
experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command of these TEM techniques under the lowest possible
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addition, you must have comprehensive experience with TEM techniques including aberration-corrected high-resolution imaging, diffraction, ETEM, EFTEM and EELS. It is critical, that you have command
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the 2025 Nobel Prize in Chemistry. Electron microscopy and electron diffraction offer powerful tools for advanced structural characterization. Aberration correction now enables imaging with true atomic
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/diffraction imaging in relativistic laser-induced plasma (BISER mechanism) using a broadband coherent X-ray source based on high-power (multi-TW, PW) femtosecond lasers. The research encompasses experiments
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-projects/nanoscale-imaging-and-spectroscopy-ir-nir-vis-beyond-diffraction-limit ) and/or applying PTR on specific materials or nano systems with efforts balanced based on candidate interests and expertise
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Commissariat à l'Energie Atomique et aux Energies Alternatives - Groupe | Gif sur Yvette, le de France | France | about 2 months ago
hardness, point defects, HAXPES, extreme environments Location: Laboratory for the Study of NanoStructures and Surface Imaging (LENSIS) at CEA Saclay, France Type of contract: PhD offer, expected start date
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information about the main supervisor of the project, please see: https://www.sljus.lu.se/pablo-villanueva-perez Work duties MAX IV is the first operational diffraction-limited storage ring in the world
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-correction, electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, selected area electron diffraction, convergent beam electron diffraction, 4D-STEM, and energy filtered imaging. Experience
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measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs