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Postdoctoral researcher (M/F), synthesis of crystal phase heterostructures by Molecular Beam Epitaxy
outcomes. Molecular beam epitaxy (MBE) growth of GaAs nanowires on patterned Si/SiO₂ substrates. Structural analysis by electron microscopy (in situ TEM, electron diffraction, zone-axis indexing). Automated
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. Conventional experimental techniques such as dilatometry, optical and electron microscopy, electron backscatter diffraction and x-ray diffraction with Rietveld refinement are available at the lab and can be used
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& acylation),Polymerization, TLC, distillation, LLE, Titrations, UV-Vis, GCMS, LCMS, HPLC,MALDI-TOF, X-ray diffraction, FTIR, Chimera software for molecular docking. Essential Duties and Responsibilities
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techniques (e.g. NMR, IR, UV-vis spectroscopy, Mass spectrometry, and X-ray diffraction) necessary for characterizing new molecules and polymers. Experience with photochemistry (e.g. quantum yield analysis
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techniques (e.g. NMR, IR, UV-vis spectroscopy, Mass spectrometry, and X-ray diffraction) necessary for characterizing new molecules and polymers. Experience with photochemistry (e.g. quantum yield analysis
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IM2NP (Institut Matériaux Microélectronique Nanosciences de Provence) UMR CNRS 7334 Aix Marseille Université | Marseille, Provence Alpes Cote d Azur | France | 18 days ago
caractérisation ex situ de la structure de grains (EBSD - Electron BackScatter Diffraction) au laboratoire MSMP (Laboratoire Mécanique, Surface, Matériaux et Procédés, Aix-en-Provence) et des techniques pour
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physical and chemical processes by enabling the structuring of materials at the nanoscale, well beyond the classical diffraction limit. These novel functionalities can either enhance inherent surface
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to learn state-of-the-art lab methodology, comprising pulsed laser deposition (PLD), atomic force microscopy (AFM), advanced X-ray diffraction (XRD), and electrochemistry. Additionally, synchrotron
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data from the European XFEL facility at DESY. Project website: https://www.mpinat.mpg.de/628848/SM-Ultrafast-XRay-Diffraction Your profile Eligible candidates have strong skills in computational
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properties. Surface characterization will be carried out using techniques such as optical microscopy, scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD