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deposition new types of ultra-thin magnetic films. The growth will be performed either by PLD or off-axis sputtering. structural characterizations including X-ray diffraction, reciprocal space mapping, AFM
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to a deeper understanding of material behaviors, paving the way for the development of next-generation high-performance materials. For more details, please view https://www.ntu.edu.sg/mse/research and
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of optical metasurfaces for the diffraction control in the visible and near infrared. Skills in the field of photonics are required, as well as the ability to use the Matlab language and commercial
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Experience with structure characterisation using microscopy and diffraction methods Desirable Application/interview Ability to work independently Essential Application/interview Evidence of presentation skill
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organic pollutants. This would require knowledge in the design and synthesis of porous frameworks, particularly in techniques such as Schlenk line, glove box, powder X-ray diffraction, electron diffraction
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their structural and optical characterization by using atomic force microscopy (AFM), scanning electron microscopy (SEM), x-ray diffraction (XRD), and photoluminescence spectroscopy (PL). The research will be
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crystallography, specifically in the structure solution and refinement of small molecule crystals using either electron or X-ray diffraction techniques. While candidates with experience in structure analysis based
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experiments that require a focused coherent beam to achieve ultimate resolution, such as ptychography and coherent diffraction imaging. Secondly, the nanofocused beam also provides prime spatial resolution
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of their properties. The primary responsibilities include synthesizing Crystalline inorganic compound, their characterization with x-ray diffraction and spectroscopic methods, as well as analysis of their magnetic and
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paramagnetic resonance (EPR), or magnetic resonance imaging (MRI) Familiarity with analytical tools: X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray computed tomography (XRCT) Expertise in