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Commissariat à l'Energie Atomique et aux Energies Alternatives - Groupe | Gif sur Yvette, le de France | France | about 2 months ago
techniques including synchrotron radiation induced Hard X-ray photoelectron spectroscopy and complementary structural analysis including high-resolution electron microscopy, X-ray diffraction and near field
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dating sediments with optically-stimulated luminescence (OSL) dating and particle size analysis of samples using a laser diffraction particle size analyzer. Subsample sediment and soil cores for analysis
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. The applications and the evidence of eligibility under the terms and conditions of the Call should be sent exclusively via the following weblink: https://posao.pmf.hr/opening-login?openingUUID=6f2b57e1-7220-489a
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synthesised in situ using a state-of-the-art pulsed laser deposition system. Key characterisations include X-ray diffraction for structural properties and temperature-dependent magneto-optical properties
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. · Physical-chemical characterisation of said materials (elemental composition, gas adsorption, IR and UV spectroscopy, X-ray diffraction, TEM, XPS, etc.). · Catalytic evaluation of the prepared materials
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information about the main supervisor of the project, please see: https://www.sljus.lu.se/pablo-villanueva-perez Work duties MAX IV is the first operational diffraction-limited storage ring in the world
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measure the extent of silicon phase transformation and plasticity underneath a silicon micro-scratch, using electron backscatter diffraction or transmission Kikuchi diffraction on focused ion beam lift-outs
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-correction, electron energy loss spectroscopy, energy dispersive X-ray spectroscopy, selected area electron diffraction, convergent beam electron diffraction, 4D-STEM, and energy filtered imaging. Experience
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, additional material characterisation with techniques such as X-ray diffraction, X-ray and neutron reflectometry and X-ray photoemesion spectroscopy will be used to provide a fundamental understanding of the
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issues) Proficiency in operating and supporting materials science laboratory equipment, such as: X-ray diffraction (XRD) Scanning electron microscopy (SEM) and sample preparation tools Thermal and